29th Midwest Symposium on Circuits and Systems

29th Midwest Symposium on Circuits and Systems

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Testability Measures in Digital Circuits - A Critique Morien W. Roberts, Parag K. La la Dept. of E.C.E., Syracuse University ... Abstract Testability measures were developed to quantify the ease of testing a design without resorting to the expenseanbsp;...


Title:29th Midwest Symposium on Circuits and Systems
Author: Mohammed Ismail
Publisher:New York : North-Holland - 1987
ISBN-13:

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